Name: Volta系列探针头
Brand: 史密斯英特康

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史密斯英特康的浮动弹簧探针设计具有高度精确度，因此能在测试晶圆级芯片封装尺寸时实现无缝部署。

史密斯英特康已面向各类应用生产了数以千计的探针头。在晶圆级别测试Volta产品线，我们增加了针对更小引脚间距测试的的晶圆尺寸，晶圆级芯片封装（WLCSP）和已知合格芯片的Volta180系列。

Volta180 系列探针卡具有优越的直流电和射频性能，提高了探针头的使用寿命和延长单次正常运行时间，并且易于维护。

		Volta 180	Volta 200	Volta 250	Volta 300	Volta 350	Volta 400
Wafer I/O Pitch		180 μm	200 μm	250 μm	300 μm	350 μm	400 μm
Minimum Probe Depth (At Test)		2.85 mm	2.85 mm	2.90 mm	3.80 mm	3.50 mm	2.90 mm
Probe Travel	Wafer Side	230 μm	230 μm	250 μm	250 μm	300 μm	300 μm
Probe Travel	PCB Side	170 μm	170 μm	150 μm	150 μm	150 μm	150 μm
Spring Material		music wire	music wire	music wire	stainless steel	stainless steel	stainless steel
Device Side Contact Material		Homogenous
Probe Tip Shape		4-Point Crown
Spring Force		6.5 gf	10 gf	15 gf	17.5 gf	16 gf	17 gf
Contact Resistance		< 200 mΩ	< 250 mΩ	< 100 mΩ	< 100 mΩ	< 70 mΩ	< 50 mΩ
Continuous Current Carrying Capacity (Room Temp.)		0.84 A	1.2 A	1.5 A	2 A	2.50 A	3 A
Insertion Loss (Pattern: R-S-R @ -1 dB)		20 GHz	22 GHz	30 GHz	20 GHz	20 GHz	20 GHz
Loop Inductance		0.65 nH	0.56 nH	0.76 nH	0.95 nH	0.92 nH	0.82 nH
Capacitance		0.40 pF	0.22 pF	0.31 pF	0.39 pF	0.41 pF	0.30 pF
Working Temperature		-55° to120°C	-55° to 120°C	-55° to 120°C	-55° to 150°C	-55° to 150°C	-55° to 150°C
Max. Number of Test Sites		Defined by the FEA [Total pin count at a defined area is the limit]
Sorted Die Test Feature (Alignment Plate and Manual Actuator)		Yes
Individual Contact Replacement		Yes

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